Information for "Interferometry and metrology"
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Basic information
| Display title | Interferometry and metrology |
| Default sort key | Interferometry and metrology |
| Page length (in bytes) | 3,715 |
| Page ID | 273 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of redirects to this page | 1 |
| Counted as a content page | Yes |
Page protection
| Edit | Allow all users (infinite) |
| Move | Allow all users (infinite) |
Edit history
| Page creator | imported>Wikipost |
| Date of page creation | 01:41, 18 March 2007 |
| Latest editor | imported>Ketterle |
| Date of latest edit | 05:38, 19 April 2009 |
| Total number of edits | 30 |
| Total number of distinct authors | 3 |
| Recent number of edits (within past 90 days) | 0 |
| Recent number of distinct authors | 0 |
Page properties
| Transcluded templates (3) | Templates used on this page: |
